Abstract:
Gamma-MnS thin films were deposited on glass and indium tin oxide (ITO) substrates at 40. C temperature by Chemical Bath Deposition (CBD) method. XRD measurements revealed that the gamma-MnS films are polycrystalline in the wurtzite phases and show a preferential orientation along the c-axis. The grain size of the films that were deposited onto the glass and ITO were calculated as 327 nm and 189 nm, respectively. The energy band gap of the films deposited onto glass and ITO were also calculated as 3.56 eV, 3.74 eV, respectively. The refractive index of the gamma-MnS at the visible region (400-700 nm) were measured as 2.1 and 1.63 for the glass and ITO substrates, respectively. Hall measurement revealed that the gamma-MnS films showed n-type conductivity and the resistivity of the gamma-MnS films deposited on the glass and ITO substrates were measured as 7.1 x 10(5) Ocm, 3.04 x 10(2) Ocm, respectively.
